2007 Syllabus

INSTRUMENTATION ENGINEERING SYLLABUS 2007

ENGINEERING MATHEMATICS

Linear Algebra: Matrix Algebra, Systems of linear equations, Eigen values and eigen vectors.

Calculus: Mean value theorems, Theorems of integral calculus, Evaluation of definite and

improper integrals, Partial Derivatives, Maxima and minima, Multiple integrals, Fourier series.

Vector identities, Directional derivatives, Line, Surface and Volume integrals, Stokes, Gauss and

Green’s theorems.

Differential equations: First order equation (linear and nonlinear), Higher order linear differential

equations with constant coefficients, Method of variation of parameters, Cauchy’s and Euler’s

equations, Initial and boundary value problems, Partial Differential Equations and variable

separable method.

Complex variables: Analytic functions, Cauchy’s integral theorem and integral formula, Taylor’s

and Laurent’ series, Residue theorem, solution integrals.

Probability and Statistics: Sampling theorems, Conditional probability, Mean, median, mode

and standard deviation, Random variables, Discrete and continuous distributions, Poisson,

Normal and Binomial distribution, Correlation and regression analysis.

Numerical Methods: Solutions of non-linear algebraic equations, single and multi-step methods

for differential equations.

Transform Theory: Fourier transform, Laplace transform, Z-transform.

INSTRUMENTATION ENGINEERING

Basics of Circuits and Measurement Systems: Kirchoff’s laws, mesh and nodal Analysis.

Circuit theorems. One-port and two-port Network Functions. Static and dynamic characteristics of

Measurement Systems. Error and uncertainty analysis. Statistical analysis of data and curve

fitting.

Transducers, Mechanical Measurement and Industrial Instrumentation: Resistive,

Capacitive, Inductive and piezoelectric transducers and their signal conditioning. Measurement of

displacement, velocity and acceleration (translational and rotational), force, torque, vibration and

shock. Measurement of pressure, flow, temperature and liquid level. Measurement of pH,

conductivity, viscosity and humidity.

Analog Electronics: Characteristics of diode, BJT, JFET and MOSFET. Diode circuits.

Transistors at low and high frequencies, Amplifiers, single and multi-stage. Feedback amplifiers.

Operational amplifiers, characteristics and circuit configurations. Instrumentation amplifier.

Precision rectifier. V-to-I and I-to-V converter. Op-Amp based active filters. Oscillators and signal

generators.

Digital Electronics: Combinational logic circuits, minimization of Boolean functions. IC families,

TTL, MOS and CMOS. Arithmetic circuits. Comparators, Schmitt trigger, timers and mono-stable

multi-vibrator. Sequential circuits, flip-flops, counters, shift registers. Multiplexer, S/H circuit.

Analog-to-Digital and Digital-to-Analog converters. Basics of number system. Microprocessor

applications, memory and input-output interfacing. Microcontrollers.

Signals, Systems and Communications: Periodic and aperiodic signals. Impulse response,

transfer function and frequency response of first- and second order systems. Convolution,

correlation and characteristics of linear time invariant systems. Discrete time system, impulse and

frequency response. Pulse transfer function. IIR and FIR filters. Amplitude and frequency

modulation and demodulation. Sampling theorem, pulse code modulation. Frequency and time

division multiplexing. Amplitude shift keying, frequency shift keying and pulse shift keying for

digital modulation.

Electrical and Electronic Measurements: Bridges and potentiometers, measurement of R,L

and C. Measurements of voltage, current, power, power factor and energy. A.C & D.C current

probes. Extension of instrument ranges. Q-meter and waveform analyzer. Digital voltmeter and

multi-meter. Time, phase and frequency measurements. Cathode ray oscilloscope. Serial and

parallel communication. Shielding and grounding.

Control Systems and Process Control: Feedback principles. Signal flow graphs. Transient

Response, steady-state-errors. Routh and Nyquist criteria. Bode plot, root loci. Time delay

systems. Phase and gain margin. State space representation of systems. Mechanical, hydraulic

and pneumatic system components. Synchro pair, servo and step motors. On-off, cascade, P, PI,

P-I-D, feed forward and derivative controller, Fuzzy controllers.

Analytical, Optical and Biomedical Instrumentation: Mass spectrometry. UV, visible and IR

spectrometry. X-ray and nuclear radiation measurements. Optical sources and detectors, LED,

laser, Photo-diode, photo-resistor and their characteristics. Interferometers, applications in

metrology. Basics of fiber optics. Biomedical instruments, EEG, ECG and EMG. Clinical

measurements. Ultrasonic transducers and Ultrasonography. Principles of Computer Assisted

Tomography.

GATE Score

The GATE SCORE of a candidate is a statistical performance index in the range 0 to 1000. It reflects the ability of a candidate, irrespective of the paper or year in which he/she has qualified. Candidates with same GATE SCORE from different disciplines and/or years can be considered to be of equal ability.GATE Score = K1 + K2 ((m-a)/s) where, m = marks obtained by the candidate.a = average of marks of all candidates who appeared in the paper mentioned on this scorecard, in the current year.s = standard deviation of marks of all candidates who appeared in the paper mentioned on this scorecard, in the current year.K1 and K2 are determined respectively from the mean and standard deviation of marks of all candidates across all papers and years since GATE 2002.

A typical qualitative interpretation of the GATE SCORE, for example, can be as follows:
Ability Level GATE Score Range
Outstanding 800 to 1000
Excellent 675 to 800
Very good 550 to 675
Good 425 to 550
Above average 300 to 425
Average 100 to 300
Below average Below 100

The cut off for various institutes vary every year. A higher cut off one year doesn't mean it'll be high the next year too.

GATE syllabus

The Graduate Aptitude Test in Engineering (GATE) is an all-India examination administered and conducted in eight zones across the country by the GATE Committee comprising Indian Institute of Science, Bangalore and seven Indian Institutes of Technology on behalf of the National Coordinating Board - GATE, Department of Education, Ministry of Human Resources Development (MHRD), Government of India.

It is regarded as a benchmark test for engineering graduates in India and is needed for admission to M.Tech and M.S. programmes in most engineering institutes in India.

The current format of the GATE exam paper pattern is:

Total of 150 marks, fully objective, with three sections

Group I: Question Numbers 1 to 20 (20 questions) will carry one mark each.

Group II: Question numbers 21 to 75 (55 questions) will carry two marks each. Out of this, Q.71 to Q.75 may be common data based questions.

Group III: Question Numbers 76 to 85 (10 questions) will carry two marks each.These questions are called linked answer questions. These 10 questions comprise five pairs of questions (76 & 77, 78 & 79, etc.). The solution to the second question of each pair (e.g. Q.77) will be linked to the correct answer to the first one (e.g. Q.76) in the pair.

Each question will have four choices for the answer. Only one choice is correct.The score card of the Qualified Candidates formerly includes GATE ScoreRank.

I'm posting here the syllabus of GATE of 2007 for various disciplines. It will be updated as the new syllabus is released.